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. Author manuscript; available in PMC: 2019 Jul 1.
Published in final edited form as: IEEE Trans Circuits Syst II Express Briefs. 2017 Jul 12;65(7):839–843. doi: 10.1109/TCSII.2017.2725988

Fig. 3.

Fig. 3.

The experimental setup, die micrograph, and floorplan of the 32-ch proof-of-concept prototype AFE, including the control block.