. Author manuscript; available in PMC: 2019 Feb 1.

Published in final edited form as: Space Sci Rev. 2017 Dec 13;214(1):19. doi: 10.1007/s11214-017-0439-4

Table 13.

Gas samples collected and analyzed

Location	Sample type
Air	LM ISO 7 cleanroom
Air	LM ISO 7 supplemental cooling cart
Air	LM ISO 8 cleanroom
Air	PHSF high bay
Air	Faring air supply used during faring transport
Air	VIF faring air supply
Air	VIF Centaur common equipment module air supply
Nitrogen/helium	Source gas for TAGSAM bottles
Nitrogen/helium	Source gas for TAGSAM bottles through bottle loading manifold
Nitrogen/helium	Pressurized TAGSAM qualification bottle after 24 hours at 40–45 °C
Nitrogen/helium	TAGSAM gas during NSI actuation
Nitrogen purge	LM purge for spacecraft
Nitrogen purge	PHSF facility purge for spacecraft
Nitrogen purge	Spacecraft in fairing transport purge
Nitrogen purge	VIF T-0 purge system
Nitrogen purge	Launch pad T-0 purge system