Table 4.
Type | Detection Principle | Advantages | Disadvantages | Precision | References |
---|---|---|---|---|---|
Piezoelectric sensor | Piezoelectric effect of piezoelectric materials | • Wide band • High sensitivity • High signal-to-noise ratio • Simple structure |
• Poor output direct current response • Unsuitable for static measurement |
μN–sub μN | [142] |
Piezoresistive sensor | The relationship between force and resistance | • Proven detection method and good frequency response | • Modest signal-to-noise ratio • Complex structure • Temperature-sensitive |
mN–sub mN | [143,144] |
Capacitive transducer | The relationship between force and capacitance change between plates | • Simple structure • Good stability • High sensitivity |
• Highly nonlinear strain | μN–sub μN | [66,69] |
Strain gauge | The relationship between the shape variable and stress | • Simple structure | • Modest detection accuracy | mN | [145] |
Polyvinylidene fluoride force transducer | Piezoelectric effect | • High linearity • High signal-to-noise ratio • Suitable for dynamic force induction |
• Cannot work under high temperature | sub μN | [146,147,148] |
Polydimethylsiloxane (PDMS) patch force transducer | Deviate from PDMS posts | • Easy to fabricate and can be used to study different types of cell characteristics | • Difficult to prepare | nN | [68,149] |
Cantilever-based force sensor | Beam deflection | • Easy to fabricate and allows vision-enabled measurement of structural deformation | • Low sensitivity and precision • Difficult to detect static forces |
nN | [150,151] |
Cantilever force transducer with an indentation probe | Beam deflection | • Simple structure • High resolution, can be used to study the force response of cells under large deformation |
• Complex mechanical structure | nN–pN | [71,152,153,154] |
Miniature camera-based force sensor | Change in diffraction efficiency | • High resonance frequency | • Difficult to fabricate • Complex optical setup |
N/A | [38] |
Magnetic effect-based sensor | The compressive magnetic effect of magnetic materials | • High measurement accuracy | • Prone to be affected by the surrounding magnetic field | nN | [155] |
Vision-based sensor | The relationship between stress and image deviation | • Non-contact measurement | • Strict requirements for image processing precision | mN–μN | [156,157] |