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. 2019 Feb 1;5(2):eaav0282. doi: 10.1126/sciadv.aav0282

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Copyright © 2019 The Authors, some rights reserved; exclusive licensee American Association for the Advancement of Science. No claim to original U.S. Government Works. Distributed under a Creative Commons Attribution License 4.0 (CC BY).

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Fig. 3 — (A and C) A reconstruction of the same ASIC, measured with Fourier ptychography (A) and conventional ptychography (C) (16). Scale bar, 2 μm. Resolution estimate for (A) is 47 nm and that for (C) is 41 nm (16). (B) The phase of the x-ray Fourier ptychographic reconstruction was compared to its conventional ptychographic counterpart. (C) The line cuts of both reconstructed phases reveal that the phase profiles match and thus a quantitative reconstruction can be provided (red for the Fourier ptychographic reconstruction and blue for “conventional” ptychography).