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. 2019 Feb 1;5(2):eaau3407. doi: 10.1126/sciadv.aau3407

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Copyright © 2019 The Authors, some rights reserved; exclusive licensee American Association for the Advancement of Science. No claim to original U.S. Government Works. Distributed under a Creative Commons Attribution NonCommercial License 4.0 (CC BY-NC).

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Fig. 3 — (A) Mapping result of local electrical resistance in sample A as measured by four-terminal probe method. The measurement setup and scanning area are schematically shown in the inset. The cross-sectional profile of the thermal amplitude is indicated in (B) for comparison. (C to E) Systematically investigated changes in thermal distribution properties versus resistance. The measurements were carried out under a constant current of 6 mA for all devices. All the LIT measurements were taken with a 10-min accumulation time. The dashed line in Fig. 3E is a guide to the eye.