Table 1.

Summary of XPS elemental analysis of surface modified pSi samples. Surface compositions are expressed as atomic percentage (%).

surface	C	O	N	F	Si
pSi-dodecene	68.6	11.9	0.3	0.9	18.2
pSi-dodecene-air plasma	22.7	52.2	1.9	0.3	22.9
pSi-dodecene-air plasma-APTES	38.4	36.1	7.4	0.5	17.7
pSi-dodecene-air plasma-APTES-CPT	37.1	39.2	6.7	0.6	16.4
pSi-dodecene-air plasma-APTES-CPT-2 wt%	70.4	19.1	10.1	0.3	0.1