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. 2019 Feb 4;9:1129. doi: 10.1038/s41598-018-37369-x

Figure 1.

Figure 1

Materials characterization. (a) FTIR, (b) XPS spectra survey (inset) high resolution N1s XPS spectra of 4NG sample, (c) Schematic suggested structure of NG based on the result of XPS analysis, (d) atomic % of nitrogen in every NG sample and their components, (e) Nitrogen adsorption-desorption isotherms of nitrogen doped graphene samples and and (f) Raman spectra.