Figure 1:

Simulation setup. Current patterns were evaluated for two voxel locations (red crosses) inside a spherical sample: a central voxel and an intermediate voxel at 3.4 cm from the center. The dielectric sphere shown in gray was surrounded by a continuous layer of high-permittivity material (blue), with a thickness (R2–R1) varied between quarter wavelength (λ/4) and full wavelength (λ) in the HPM at the operating frequency of 297.2 MHz. The radius R3 of the surface where the current patterns were defined (orange dotted line) was kept constant, except for the results shown in Figure 10, for which it was increased to 14 cm to accommodate thicker HPM layers.