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. Author manuscript; available in PMC: 2019 Feb 13.
Published in final edited form as: ACS Appl Mater Interfaces. 2017 Apr 19;9(17):14618–14632. doi: 10.1021/acsami.7b00268

Figure 1.

Figure 1.

High-resolution XPS C1s spectra of GOPS (a), GOPS-CA(PEG)8 (b) and GOPS-CA(PEG)8-DOPE (c) functionalized silicon wafers, and the corresponding XPS wide scan spectra (d), and high-resolution XPS N1s spectrum (e) of a GOPS-CA(PEG)8-DOPE-functionalized silicon wafer.