Table 1.

Options for Coatings and Scanning Electron Microscopy (SEM) Operation.

	Pt-sputter Coating	Carbon Coating	Carbon Coated Slide	Pt-Deposition	kV	Detector
High-resolution SEM	3–5 nm				0.8–1	SE/in-lens SE
High res. immuno-SEM (10 nm gold)		3–5 nm	(+)		1–2 5–20	EsB QBSD
High res. immuno-SEM (5 nm gold)			+		1 5–20	EsB QBSD
SEM for depth information		3–5 nm			5–30	QBSD
SEM for element analysis		3–15 nm			1–30	EDX
CPD+FIB/SEM		3–15 nm		(0.5–1 µm)	1.5	EsB
Flat embedded+FIB/SEM		10–30 nm		(0.5–1 µm)	1.5	EsB

SE, secondary electrons; EsB, energy selective backscattered electron; QBSD, quadrant backscatter electron detector; EDX, energy dispersive X-ray; CPD, critical point dried; FIB, focused ion beam.