Table 2. Shizitan 29, layer 8 and 7 (base): The retouched lithic sample.
| Composites | Denticulates | Endscrapers | Esquillés | Marginal retouch | Notches | Points | Scrapers | |||
|---|---|---|---|---|---|---|---|---|---|---|
| 7 Base | BF | 0 | 0 | 0 | 2 | 1 | 0 | 0 | 2 | 5 |
| RF | 0 | 0 | 0 | 1 | 1 | 0 | 0 | 0 | 2 | |
| Q | 0 | 0 | 1 | 1 | 3 | 3 | 1 | 5 | 14 | |
| O | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 1 | 1 | |
| 0 | 0 | 1 | 4 | 5 | 3 | 1 | 8 | 22 | ||
| 8 | BF | 0 | 0 | 0 | 3 | 2 | 0 | 0 | 4 | 9 |
| RF | 0 | 0 | 0 | 1 | 0 | 1 | 0 | 0 | 2 | |
| Q | 1 | 2 | 0 | 0 | 0 | 0 | 0 | 1 | 4 | |
| O | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | |
| 1 | 2 | 0 | 4 | 2 | 1 | 0 | 5 | 15 |
Typological frequencies of retouched flakes from Shizitan 29, layers 8 and 7 Base according to raw materials: (BF) Black flint; (RF) River flint; (Q) quartz/quartzite; (O) other materials.