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. 2019 Feb 26;9:2766. doi: 10.1038/s41598-019-39435-4

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© The Author(s) 2019

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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Magnetization of Co₂MnSi thin films at 300 K in fields up to 20 kOe for a non-irradiated reference sample (grey dots and lines) and the irradiated samples with He⁺ ion fluences ranging from 10¹³ ions/cm² up to 5 × 10¹⁵ ions/cm². The data have been normalized to the data of the reference sample in saturation (20 kOe). The diamagnetic background from the substrate and the capping has been subtracted (See text for details).