Table 5. Age effects on technology-related strain via techno-stressors and active coping.
| Outcome: strain | Estimate | SE | p | LL | UL | R2 | p |
| age | -.068 | .024 | .004 | -.106 | -.029 | .618 | < .001 |
| tstr | .790 | .021 | .000 | .756 | .824 | ||
| active | .012 | .036 | .742 | -.048 | .072 | ||
| dep | -.043 | .033 | .200 | -.097 | .012 | ||
| Total, Direct and Indirect Effects | |||||||
| age to strain | Estimate | SE | p | LL | UL | ||
| total | -.122 | .033 | .000 | -.176 | -.068 | ||
| total indirect | -.054 | .025 | .029 | -.095 | -.013 | ||
| via tstr | -.029 | .024 | .224 | -.069 | .010 | ||
| via active | .000 | .001 | .753 | -.002 | .002 | ||
| via tstr and active | .000 | .000 | .748 | .000 | .000 | ||
| direct effect | -.068 | .024 | .004 | -.106 | -.029 | ||
Note. Standardized model results, N = 1,216, SE = standard error, p = two-tailed p-value, LL/ UL = 95% lower-level and upper-level confidence interval, active = active coping, tstr = techno-stressors, dep = ICT dependency