Table 6. Age effects on technology-related strain via techno-stressors and social coping.
| outcome: strain | Estimate | SE | p | LL | UL | R2 | p |
| age | -.065 | .024 | .006 | -.104 | -.026 | .618 | < .001 |
| tstr | .785 | .021 | .000 | .750 | .820 | ||
| social | .030 | .033 | .372 | -.025 | .084 | ||
| dep | -.049 | .029 | .097 | -.049 | .000 | ||
| Total, Direct and Indirect Effects | |||||||
| age to strain | Estimate | SE | p | LL | UL | ||
| total | -.122 | .033 | .000 | -.176 | -.068 | ||
| total indirect | -.057 | .025 | .022 | -.097 | .016 | ||
| via tstr | -.029 | .024 | .222 | -.069 | .010 | ||
| via social | -.003 | .003 | .394 | -.008 | .002 | ||
| via tstr and social | .000 | .000 | .447 | -.001 | .000 | ||
| direct | -.065 | .024 | .006 | -.104 | -.026 | ||
Note. Standardized model results, N = 1,216, SE = standard error, p = two-tailed p-value, LL/ UL = 95% lower-level and upper-level confidence interval, social = social coping, tstr = techno-stressors, dep = ICT dependency