Table 7. Age effects on technology-related strain via techno-stressors and behavioral disengagement.
| outcome: strain | Estimate | SE | p | LL | UL | R2 | p |
| age | -.030 | .022 | .175 | -.067 | .007 | .665 | .000 |
| tstr | .531 | .050 | .000 | .449 | .613 | ||
| diseng | .331 | .055 | .000 | .241 | .421 | ||
| dep | .021 | .024 | .380 | -.018 | .059 | ||
| Total, Direct and Indirect Effects | |||||||
| age to strain | Estimate | SE | p | LL | UL | ||
| total | -.122 | .033 | .000 | -.176 | -.068 | ||
| total indirect | -.091 | .027 | .001 | -.136 | -.046 | ||
| via tstr | -.020 | .016 | .226 | -.046 | .007 | ||
| via diseng | -.038 | .011 | .000 | -.055 | -.020 | ||
| via tstr and diseng | -.010 | .008 | .245 | -.023 | .004 | ||
| direct | -.030 | .022 | .175 | -.067 | .007 | ||
Note. Standardized model results, N = 1,216, SE = standard error, p = two-tailed p-value, LL/ UL = 95% lower-level and upper-level confidence interval, diseng = behavioral disengagement, tstr = techno-stressors, dep = ICT dependency