Table 8. Coping effects on technology-related strain over time.
trs to strain | Estimate | SE | p | LL | UL | |
---|---|---|---|---|---|---|
total | .299 | .034 | .000 | .244 | .355 | |
A | direct | .292 | .034 | .000 | .237 | .347 |
via active | .007 | .004 | .035 | .002 | .013 | |
B | direct | .290 | .034 | .000 | .235 | .346 |
via social | .009 | .004 | .025 | .003 | .016 | |
C | direct | .266 | .032 | .000 | .213 | .319 |
via diseng | .033 | .010 | .001 | .017 | .049 |
Note. Standardized model results, A = mediation model with active coping as mediator, B = mediation model with social coping as mediator, C = mediation model with behavioral disengagement as mediator, SE = standard error, p = two-tailed p-value, LL/ UL = 95% lower-level and upper-level confidence interval, active = active coping, social = social coping, diseng = behavioral disengagement, tstr = techno-stressors, strain = technology-related strain