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. 2019 Feb 13;9(2):256. doi: 10.3390/nano9020256

Figure 2.

Figure 2

Local electric field enhancement (A) in the vicinity of one AgNP for incident radiation at 633 nm (A, top scheme) and at 785 nm (A, bottom scheme). Graphical representation of the electric field strength (B) (normalized to the incident field) along the y-axis of the simulation crossing the points of greater electric field intensity around the apexes of the AgNP.