Figure 6.

AFM patterns obtained from the maps acquired on the (a) steel layer; (b) CIM sample (20 mm distance from the gate); (c) 160-18 sample (20 mm distance from the gate) and (d) 160-18 sample (50 mm distance from the gate). Three patterns are reported for each sample: the flattened pattern, and the patterns obtained applying 0.1 and 0.2 µm⁻¹ high pass filters.