Table 4.
Parameters used simulation for GaInP, GaAs, Si, and InGaAs subcells.
| Parameters | GaInP | GaAs | InGaAs | Si |
|---|---|---|---|---|
| Band gap (eV) | 1.9 | 1.424 | 0.74 | 1.1 |
| Electron affinity (eV) | 4.16 | 4.07 | 4.49 | 1.05 |
| Relative permittivity | 11.6 | 13.2 | 12.5 | 11.9 |
| CB effective density of state (cm−3) | 1.3 × 1020 | 4 × 1017 | 2.1 × 1017 | 2.8 × 1019 |
| VB effective density of state (cm−3) | 1.28 × 1019 | 9 × 1018 | 7.7 × 1018 | 1.04 × 1019 |
| Electron mobility (cm2/Vs) | 500 | 3197 | 12260 | 1500 |
| Hole mobility (cm2/Vs) | 30 | 232 | 300 | 450 |
| Radiative recombination coefficient (cm3/s) | 5 × 10−9 | 1.3 × 10−10 | 1.43 × 10−10 | 1.8 × 10−15 |
| Auger electron capture coefficient (cm6/s) | — | 5 × 10−31 | 8.1 × 10−29 | 3 × 10−31 |
| Auger hole capture coefficient (cm6/s) | — | 5 × 10−31 | 8.1 × 10−29 | 3 × 10–31 |
| SRH τn (ns) | — | 9 × 102 | 2 × 104 | 4.3 × 103 |
| SRH τp (ns) | — | 9 × 102 | 2 × 104 | 6.1 × 103 |