Table 3.

Height parameters of the AFM analysis of the uncoated, 50 nm, 100 nm, and 150 nm coated SS substrates.

Height Parameters	Film Thickness (nm)
	0	50	100	150
Root mean square roughness (nm)	12	11.5	9.62	6.86
Skewness	−1.08	−1.0	−0.654	−0.535
Kurtosis	16.8	18	19.6	6.39
Maximum peak height (nm)	131	119	119	55.4
Maximum valley depth (nm)	160	149	118	64.1
Maximum height of surface (nm)	291	268	236	120
Average roughness (nm)	7.87	7.48	6.0	4.88