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. 2019 Feb 3;11(2):257. doi: 10.3390/polym11020257

Figure 8.

Figure 8

Figure 8

AFM images with scan area taken on the SiOx-coated side of S-0 (a) and S-d (b) films, and corresponding values of arithmetic average roughness (Ra) and root-mean square roughness (Rq).