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. 2019 Feb 20;11(2):378. doi: 10.3390/polym11020378

Figure 3.

Figure 3

Atomic force microscopy (AFM) topography images of chitosan thin film over an area of 20 × 20 µm2 irradiated with fs laser at λ = 800 nm, τ = 130 fs at different I and N: (a) I = 7.9 × 1014 W/cm2, N = 1, Rrms = 0.780 µm; (b) I= 7.9 × 1014 W/cm2, N = 2, Rrms = 2. 266 µm; (c) I = 7.9 × 1014 W/cm2, N = 5, Rrms = 2. 430 µm; (d) I = 1.5 × 1015 W/cm2, N = 1, Rrms = 1.617 µm; (e) I = 1.5 × 1015 W/cm2, N = 2, Rrms = 2.272 µm; (f) I = 1.5 × 1015 W/cm2, N = 5, Rrms = 2.480 µm.