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. Author manuscript; available in PMC: 2019 Apr 1.
Published in final edited form as: Proc IEEE Inst Electr Electron Eng. 2018 Feb 6;106(4):690–707. doi: 10.1109/JPROC.2017.2789319

Algorithm 3.

ACC Testing

for each test sample x do
  Assign it to cluster l=arg maxlx𝒞β𝒞l.
  Classify x with βl*.
end for