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. 2019 Mar 7;12(5):780. doi: 10.3390/ma12050780

Figure 3.

Figure 3

Experimental structure of a portion of the new selector with a thickness of 3 mm and a take-off angle of 40° (a); electron backscattering diffraction (EBSD) IPF-X (color code chosen along the growing direction) maps of the grain structure evolution (b1d1) and the EBSD inverse pole figures in growth direction with various heights (b2d2).