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. 2019 Feb 27;19(3):2178–2185. doi: 10.1021/acs.nanolett.9b00752

Figure 3.

Figure 3

Single fND and fND clusters imaged by energy-filtered transmission electron microscopy (EFTEM). (a,d) CLEM overlay; (b,e) the corresponding TEM bright-field micrograph. (c,f) EFTEM micrograph acquired at an energy loss of 100 eV with 10 eV slit width. The white arrows indicate the detection of individual fNDs. The insets in (b,c) represent line profile values of respective selected line (red dots line). (g) EEL spectra of embedded fNDs (black), the embedded cell (red) and a resin-only area (green), corresponding to the positions indicated in (e) (the inset of (g) shows a zoom into the energy loss range from 10 to 120 eV). The spectra were acquired by focusing the electron beam on the respective area. (h) The line profile value of the inset (EFTEM micrograph of two closely located fNDs, Gaussian function fit of the data. (a,c) The magnification of the region marked by the dashed box in Figure 2c; (d–f)Magnification of the area marked by the solid box in Figure 2c. Scale bar: 1 μm.