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. 2017 Jul 17;3:17032. doi: 10.1038/micronano.2017.32

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Copyright © 2017 The Author(s)

This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/

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Raman characterization of MoS₂ (a) and WS₂ (b) dispersed within the RF matrix of the aerogel (c) for samples synthesized from 17 mg mL⁻¹ TMD dispersions. The Raman scattering of the aerogel (c) was collected from the WS₂ composite. For each RF-supported TMD, the bulk Raman spectra is displayed offset for comparison. In addition, the supported TMD and bulk Raman spectra were collected without adjusting the spectrometer grating to prevent alignment-induced shifts in wavenumber. All wavenumbers were further calibrated with a silicon wafer. Vertical dotted lines represent peak centers of the in-plane (E¹_2g) and out of plane (A_1g) modes of the exfoliated TMD’s to emphasize the shift from their bulk counterparts due to exfoliation in the case of MoS₂ and WS₂.