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. 2019 Jan 8;31(2):242–250. doi: 10.1016/j.sdentj.2018.12.004

Table 3.

Topographic analyses of the substrate surface roughness (nm).

Substrates Sa (nm) Sdr (%) Sdq (/nm2) Sq (nm)
A. untreated Ti 13 ± 1 0.87 ± 0.06 0.133 ± 0.05 3.15 ± 0.3
B. treated Ti with laser 23 ± 1.3 5.76 ± 0.4 0.361 ± 0.06 7.08 ± 0.8
C. β-TCP coat 33 ± 2 9.26 ± 0.3 0.445 ± 0.07 9.37 ± 0.6

(±SD) Sa: roughness average, Sdq: slop root mean square, Sdr: increment of the interfacial surface area relative to a flat plane base line, Sq: height root mean square of the surface.