Figure 4.
NEXAFS spectroscopy. (a) B K-edge spectra and (b) N K-edge spectra of the h-BN film grown on the Ni(111) for different incident angles θ (the angle between the sample plane and the X-ray propagating direction, as marked in the figure). (c) B K-edge spectra of the h-BN films grown on the Ni(111) and sapphire, measured at the incident angle θ of 30°. (Inset) Magnified spectra in the range between 190 eV and 194 eV for showing the low-energy shoulder A1, the high-energy shoulders A2, A3.