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. Author manuscript; available in PMC: 2019 Apr 15.
Published in final edited form as: J Appl Crystallogr. 2018;51(Pt 3):10.1107/S160057671800643X. doi: 10.1107/S160057671800643X

Figure 1.

Figure 1

(a) Schematic showing combined USAXS/SAXS/WAXS instrument configurations highlighting advances and coordinated motions, shown in red [I0 = ion chamber (beam monitor), Diode = USAXS detector, Img = X-ray imaging camera for surveying sampling position]. (b) Generic example of USAXS/SAXS/WAXS data, showing combined USAXS/SAXS data (main plot) and XRD data (lower inset), for precipitate formation in an advanced alloy, all data measured in real time as a function of annealing temperature and time (see upper inset).