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. 2019 Apr 19;5(4):eaau6478. doi: 10.1126/sciadv.aau6478

Fig. 4. Temperature dependence and extraction of intervalley scattering length.

Fig. 4

(A) Measured Vnl as a function of temperature at different Vg for monolayer MoS2. (B) Temperature dependence of multilayer MoS2 at different Vg (dots) and the calculated trends (lines) using the modified ohmic equation, Vohmic=Vds(2RC+ρshL1W1)ρshWW1eπLW, with the consideration of the contact resistance contribution (see section S1). Note that the trends of Vnl with respect to temperature in (A) and (B) are completely opposite. (C) Device geometry and corresponding valley-circuit model that define the geometric parameters in Eq. 1. Details are given in section S3. (D) Temperature dependence of Rnlnorm (normalized to the maximum point) measured at Vg = 58 V [orange dots in (A)]. The empirical fittings use λ(T)=5.5T0.470.16 (dashed blue line) and λ=15T0.73 at T > 100 K (green line). Inset: Calculated temperature dependence of valley Hall angle, θ. (E) λ (T) extracted from Rnl and the power-law dependence described in (D). Inset: Theoretically calculated intervalley scattering length (solid line) and λT0.6 to guide the eye (dashed line).