Table 1. Effect of possible systematic or random errors on the ETE scale, eq (1).

Systematic or random changes in the constants a and b of eqs (3) and (4) and of temperatures on the ETE scale below 1 °K are listed for the following arbitrary, but plausible, cases:

Case 1. the fit of the input (P₃, T₅₈) data expressed as the 95 percent confidence limit [53] for the prediction of a value of ln P at any single temperature (see fig. 1);

Case 2. random errors of ±3 percent in f_x (C_sat);

Case 3. random errors of ±3 percent in ϵ, eq (4a) of Part II;

Case 4. a systematic error of −3 percent in all C_sat values, and hence in f_x(C_sat);

Case 5. a systematic error of +3 percent in all values of ϵ;

Case 6. the difference between the empirical function, f_x(V_L), and the numerically integrated values of the thermodynamic term, $f\left(V_L\right)={\int }_0^T{V}_L{(dP/dT)}_{\mathrm{sat}}dT$; and

Case 7. the increase of all values of input temperatures between 0.9 and 2.0 °K by adding 0.002 deg to each T₅₈.

Case	Δa	Δb	ΔT
			1.0 °K	0.8 °K	0.6 °K	0.4 °K	0.2 °K
	J/mole	J/mole deg	mdeg	mdeq	mdeq	mdeg	mdeq
1-	±0.006	±0.004	±0.4	±0.3	±0.3	±0.2	±0.1
2-	-	-	0. 0	±0.1	±0.2	±0.4	±0.4
3-	-	-	±0. 2	±0.1	0.0	0.0	0.0
4-	0. 069	−0.060	0.2	0.5	0.8	1.0	1.0
5-	0. 073	−0.076	0.2	0.4	0.5	0.6	0.5
6-	-	-	−0.1	−0.1	−0.1	0.0	0.0
7-	0.094	−0.026	-	1.7	1.5	1.2	0.7