| FIB | focused ion beam |
| GDOES | glow discharge optical emission spectrometry |
| PVD | physical vapor deposition |
| SAW | surface acoustic wave |
| SEM | scanning electron microscope |
| XRF | X-ray fluorescence analysis |
| FIB | focused ion beam |
| GDOES | glow discharge optical emission spectrometry |
| PVD | physical vapor deposition |
| SAW | surface acoustic wave |
| SEM | scanning electron microscope |
| XRF | X-ray fluorescence analysis |