Fig. 1.

Structured illumination microscopy (SIM) with laterally-translated Scotch tape as the patterning element, achieving 4× resolution gain. Our imaging system has both an incoherent arm, where Sensor-F captures raw fluorescence images (at the emission wavelength, ${\lambda }_{\text{em}}=605$ nm) for fluorescence super-resolution, and a coherent arm, where Sensor-C1 and Sensor-C2 capture images with different defocus (at the laser illumination wavelength, ${\lambda }_{\text{ex}}=532$ nm) for both super-resolution phase reconstruction and speckle trajectory calibration. OBJ: objective, AP: adjustable iris-aperture, DM: dichroic mirror, SF: spectral filter, ND-F: neutral-density filter.