Skip to main content
. 2019 May 3;5(5):eaav3430. doi: 10.1126/sciadv.aav3430

Fig. 3. Fast doping of the MoTe2 transistor and stability of the doped MoTe2 device.

Fig. 3

(A) p-to-n transition of device B. The device was biased at Vgs = −60 V throughout the measurement. UV light was turned on at ~0.58 s, switching the device from an on-state p-type FET to an off-state n-type FET within approximately 80 ms. (B) Switching process from on-state n-type FET to off-state p-type FET. The transition time is around 600 ms, ~10 times slower compared to the p-to-n transition. Stability tests of the doped n-type (C) and p-type (D) MoTe2 FETs in ambient air and temperature. Insets are the on-state current and threshold voltage (Vth) of each state as a function of time. The Vds was 500 mV.