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. 2019 May 6;5:18. doi: 10.1038/s41378-019-0057-2

Table 3.

Summary of the bias output repeatability test with ASCS using an integrator phase shift circuit (sample device G01)

Test time Average bias (deg/s, 1-h data) Bias stability (1σ) (deg/h, 1-h data) Warm-up time (s)
1 0.7348 9.31 2
2 0.7353 9.48 2
3 0.7344 9.37 2
4 0.7346 9.43 2