Table S3.
Peak identification list for XRD pattern for CHEM-TeNWs
| Position (°2θ) | Height (cts) | FWHM (°2θ) | d-spacing (Å) | Rel. Int. (%) | Tip width (°2θ) | Matched by |
|---|---|---|---|---|---|---|
| 13,1969 | 741,73 | 0,2686 | 6,70,902 | 15,76 | 0,3224 | 00-032-1167; 00-054-1863 |
| 23,0429 | 4707,03 | 0,1535 | 3,85,981 | 100,00 | 0,1842 | 00-036-1452 |
| 26,6138 | 357,02 | 0,3454 | 3,34,947 | 7,58 | 0,4145 | 00-032-1167 |
| 27,5994 | 3979,25 | 0,1535 | 3,23,206 | 84,54 | 0,1842 | 00-036-1452 |
| 36,4139 | 50,56 | 0,2303 | 2,46,739 | 1,07 | 0,2763 | |
| 38,3353 | 482,31 | 0,1535 | 2,34,803 | 10,25 | 0,1842 | 00-036-1452 |
| 40,4878 | 2325,95 | 0,1919 | 2,22,803 | 49,41 | 0,2303 | 00-036-1452; 00-032-1167 |
| 43,3289 | 383,69 | 0,2303 | 2,08830 | 8,15 | 0,2763 | 00-036-1452 |
| 47,0262 | 505,58 | 0,2303 | 1,93,237 | 10,74 | 0,2763 | 00-036-1452; 00-054-1863 |
| 49,6237 | 941,80 | 0,1919 | 1,83,714 | 20,01 | 0,2303 | 00-036-1452 |
| 51,3913 | 116,05 | 0,3070 | 1,77,803 | 2,47 | 0,3684 | 00-036-1452 |
| 56,8808 | 221,45 | 0,2686 | 1,61,878 | 4,70 | 0,3224 | 00-036-1452; 00-054-1863 |
| 63,7370 | 438,99 | 0,2303 | 1,46,019 | 9,33 | 0,2763 | 00-036-1452 |
| 65,8686 | 324,54 | 0,2303 | 1,41,800 | 6,89 | 0,2763 | 00-036-1452 |
| 72,0718 | 98,14 | 0,3838 | 1,31,047 | 2,08 | 0,4605 | 00-036-1452 |
| 73,6438 | 114,88 | 0,5373 | 1,28,633 | 2,44 | 0,6447 | 00-036-1452 |
| 75,6068 | 136,85 | 0,3838 | 1,25,774 | 2,91 | 0,4605 | 00-036-1452 |
| 82,2074 | 76,41 | 1,6848 | 1,17,169 | 1,62 | 2,0218 | 00-036-1452 |
Abbreviations: CHEM-TeNWs, chemically synthesized tellurium nanowires; FWHM, full width at half maximum; XRD, X-ray powder diffraction; Rel. Int., relative intensity.