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. 2019 May 3;14:3155–3176. doi: 10.2147/IJN.S175640

Table S2.

List of identified patterns on XRD analysis of GREEN-TeNWs

Reference code Score Compound name Displacement (°2θ) Scale factor Chemical formula
04-016-5121 44 Tellurium 0,000 0,840 Te
04-003-5854 36 Tellurium oxide 0,000 0,031 TeO2
00-043-1048 25 Tellurium oxide 0,000 0,028 TeO3
00-067-1538 30 Poly(ethylene glycol) 7500 0,000 0,093 ((CH2)2O)n

Abbreviations: GREEN-TeNWs, green-synthesized tellurium nanowires; XRD, X-ray powder diffraction.