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. 2019 May 3;14:3155–3176. doi: 10.2147/IJN.S175640

Table S4.

List of identified patterns on XRD analysis of CHEM-TeNWs

Reference code Score Compound name Displacement (°2θ) Scale factor Chemical formula
00-036-1452 64 Tellurium, syn 0,000 0,890 Te
00-032-1167 43 Sodium Tellurate Hydrate 0,000 0,170 Na2Te4O9 14.5 H2O
00-054-1863 17 5,7-Dihydroxy-4H-4-chromenone 0,000 0,281 C9H6O4

Abbreviations: CHEM-TeNWs, chemically synthesized tellurium nanowires; XRD, X-ray powder diffraction.