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. 2019 Apr 29;377(2147):20180413. doi: 10.1098/rsta.2018.0413

Figure 1.

Figure 1.

Conventional laboratory powder X-ray diffractometer diffractograms, versus 2θ from (a) a well-crystallized material and (b) a nanomaterial, showing the excessive peak broadening and loss of information in the signal in the case of the nanomaterial. Adapted from [8]. (Online version in colour.)