Figure 3.

Raw diffraction data (a) and after dividing by the square of the X-ray atomic form factor and multiplied by Q (b). For many years, the high-Q region in an X-ray experiment was thought to contain little or no information, but the advent of synchrotrons allowed the important weak signals in this region to be measured with good accuracy. As a result, we obtain a signal that contains greatly more information from nanomaterials than in traditional measurements and data treatments. (Online version in colour.)