Table 2. List of desirable components for an electron diffractometer.

Item	Description	Reference(s)
Köhler illumination	Ensures parallel beam at sample	Benner & Probst (1994 ▸)
STEM	Low dose of sample imaging; beam position should be maintained between STEM mode and diffraction mode
High-precision goniometer	Full sample rotation enables two-click centring; modern mechanics with 100 nm precision enable reduced beam size	Schneider et al. (2014 ▸), Waltersperger et al. (2015 ▸)
Parameter readout	Experimental parameters required for data processed transferred as metadata	See main text
Energy filter	Noise reduction	Yonekura et al., 2002 ▸)
Horizontal layout	Improved goniometer (precision)	Vainshtein (1964 ▸)