Table 2. Acquisition times for 10 000 diffraction patterns for different boundary conditions at the European XFEL and LCLS II.

For SPB/SFX, the hit probabilities per pulse are provided for ion densities of 1000 and 10 000 mm⁻³ also used in Table 1 ▸ using both the large and small focus XFEL beam. Using the maximum number of 13 500 pulses s⁻¹, the diffraction patterns acquired per second and the time required for 10 000 are determined. The last row provides values for LCLS II. Here, a maximum repetition rate of 1 MHz can be achieved; however, the detector will only support up to 10 kHz, which has therefore been used to calculate the number of GroEL ions that would be trapped in that time and would be available for recording diffraction patterns.

Ion density (mm−3)	Beam (µm)	Hits per pulse	Patterns (s−1)	t for 10 000 patterns (min)
1000	1	0.00079	11	16
1000	0.1	7.9 × 10−6	0.11	1572
10000	1	0.0079	106	1.6
10000	0.1	7.9 × 10−5	1.1	157
93	1	7.3 × 10−5	0.73	228