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. 2019 May 14;9:7334. doi: 10.1038/s41598-019-43667-9

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© The Author(s) 2019

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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Material property of the fabricated CuO nanofilm. (a) Surface SEM images (upper panels) and cross-sectional SEM images (lower panels) of the CuO nanofilms annealed at 400, 500, 600, and 700 °C, respectively. Insets of lower panels show cross-sectional schematics of the CuO nanofilms. (b) TEM image, (c) Magnified TEM image, and (d) HRTEM image of the CuO nanofilm annealed at 700 °C. (e) Measured grain sizes, (f) XPS spectra results (top: wide-scan spectrum, middle: spectra for Cu 2 p, bottom: spectra for O1 s), and (g) XRD results of the nanofilms annealed at various annealing temperatures.