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. 2019 May 14;9:7334. doi: 10.1038/s41598-019-43667-9

Figure 6.

Figure 6

Large-area (4-inch) uniformity and device reliability of the fabricated CuO photodetector. (a) Photograph of the fabricated photodetector array (left panel) and magnified optical microscope images of the devices (right panels). (b) Photosensitivity histogram of 50 devices measured under the light intensity of 0.840 mW/cm2 at 3 V bias. (c) Time-dependent current under repeated photo-switching with the light intensity of 2.92 mW/cm2 at 3 V bias. (d) Stability test result of the photodetector measured under the light intensity of 2.92 mW/cm2 with 3 V bias for 31 days.