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. Author manuscript; available in PMC: 2019 May 23.
Published in final edited form as: Nanotechnology. 2018 Jun 18;29(36):365302. doi: 10.1088/1361-6528/aacd33

Fig. 5.

Fig. 5

SEM images of the Si master (a, e) and imprinted COC substrates (b-c and f-h) from different UV-resin molds replicated from the Si master: top-view images (a-d) and their cross-sectional profiles (e-h). The thermal NIL performance of a UV-resin mold was determined by measuring the cross-sectional profile of the imprinted nanochannel.