FIG. 3.

Alignability scores across MIC in different repeat types. Repeat type is shown on X-axis and alignability score at MIC site is on Y-axis. Repeat type “None” represents MIC that do not overlap known repeats. Sample size for each category is displayed at mean alignability score for the category. (a) Alignability scores across SNV MIC with the signature of an inherited deletion. (b) Alignability scores across SNV MIC without deletion signatures. (c) Alignability scores across Indel MIC with deletion signatures. (d) Alignability scores across Indel MIC without deletion signatures. LINE, long interspersed nuclear elements; LTR, long terminal repeats; SINE, short interspersed nuclear elements.