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. 2019 May 28;10:2351. doi: 10.1038/s41467-019-10289-8

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© The Author(s) 2019

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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Fig. 1 — Structural evolution and characterization of quasi-metallic silicon. a, b Schematic of each stage for (a) QMS and (b) bare Si. c Scanning transmission electron microscopy (STEM) image. d, e Corresponding energy-dispersive X-ray spectroscopy (EDS) maps for (d) Si and (e) sulfur. f EELS spectra for elemental sulfur, bare Si, and QMS (inset: STEM image of the EELS measurement position). g, h High-magnification STEM images of QMS. Scale bars, 1 μm (c–e); 50 nm (f); 5 Å (g, h)