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. Author manuscript; available in PMC: 2019 May 30.
Published in final edited form as: J Phys Chem B. 2017 Sep 14;121(38):8991–9005. doi: 10.1021/acs.jpcb.7b05885

Table 3.

Calculations for the RMM and RBM Mathematical Models for Si–O–N Filmsa

RMM, [Si–Si]–[Si–O]–[Si–N]
RBM, SizOxNy
partial charge (Pi)
sample a:b Si–Si Si–O Si–N z x y Si O N Pi
Si3N4 1.73 0.02 0.04 0.94 1.00 0.00 1.33 0.24   0.00 −0.18 0.00
1 1.72 0.05 0.11 0.83 1.00 0.14 3.86 0.36 −0.21 −0.09 0.00
2 1.7 0.01 0.35 0.64 1.00 0.49 3.51 0.38 −0.20 −0.08 0.00
3 0.01 0.63 0.36 1.00 1.24 2.76 0.40 −0.18 −0.06 0.00
4 1.2 0.08 0.90 0.02 1.00 3.65 0.35 0.49 −0.13 −0.01 0.00
5 1.15 0.00 1.00 0.00 1.00 4.00 0.00 0.51 −0.13   0.00 0.00
SiO2 1.02 0.01 0.99 0.00 1.00 2.00 0.00 0.40 −0.20   0.00 0.00
a

a:b represents the peak area ratio based on XANES analysis of the silicon L-edge. Partial charge calculations assert the validity of the RBM model (∑Pi = 0).