Skip to main content
. 2019 May 31;5(5):eaau9593. doi: 10.1126/sciadv.aau9593

Fig. 2. Simulation results for characterizing the polarization diversity OAM generator.

Fig. 2

(A) Purity (y-pol. OAM+1) versus mesh size used in the 3D-FDTD simulations (length l: 3.6 μm; depth h: 60 nm). (B) Purity of polarization diversity OAM modes versus length l of the grating region (depth h: 60 nm). (C) Purity of polarization diversity OAM modes versus depth h (length l: 3.6 μm). (D) Purity of polarization diversity OAM modes versus wavelength (length l: 3.6 μm; depth h: 60 nm). (E) Scattering efficiency (y-pol. OAM+1) without and with a reflector versus depth h (length l: 3.6 μm). (F) Scattering efficiency (y-pol. OAM+1) without and with a reflector versus thickness of the SiO2 substrate (length l: 3.6 μm; depth h: 120 nm). (G) Transmission/reflection efficiency versus depth h (length l: 3.6 μm). (H) Central wavelength versus depth h (length l: 3.6 μm). (I) Scattering efficiency versus wavelength at two depths of 100 and 120 nm (length l: 3.6 μm).