Table 2.
sample | peak position (2θ) | diffraction plane (hkl) | FWHM (rad) | crystallite size (D) (nm) |
---|---|---|---|---|
S0 | 44.6° | (111) | 0.012 | 11 ± 1 |
S1 | 44.6° | (111) | 0.011 | 12 ± 1 |
S2 | 38.4° | (111) | 0.0069 | 21 ± 1 |
S3 | 38.4° | (111) | 0.0076 | 20 ± 1 |
sample | peak position (2θ) | diffraction plane (hkl) | FWHM (rad) | crystallite size (D) (nm) |
---|---|---|---|---|
S0 | 44.6° | (111) | 0.012 | 11 ± 1 |
S1 | 44.6° | (111) | 0.011 | 12 ± 1 |
S2 | 38.4° | (111) | 0.0069 | 21 ± 1 |
S3 | 38.4° | (111) | 0.0076 | 20 ± 1 |